Invention Grant
- Patent Title: Systems and methods for comparative interferogram spectrometry
- Patent Title (中): 比较干涉图谱系统和方法
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Application No.: US12540986Application Date: 2009-08-13
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Publication No.: US07869050B2Publication Date: 2011-01-11
- Inventor: George G. He , Diane E. Deterline
- Applicant: George G. He , Diane E. Deterline
- Applicant Address: US VA Fredricksburg
- Assignee: Eoir Technologies, Inc.
- Current Assignee: Eoir Technologies, Inc.
- Current Assignee Address: US VA Fredricksburg
- Agency: Van Cott, Bagley, Cornwall & McCarthy PC
- Agent Steven L. Nichols
- Main IPC: G01B9/02
- IPC: G01B9/02 ; G01J3/45
Abstract:
A method for determining a background noise level includes receiving interferogram data; determining at least one measure of interferogram quality; accumulating said received interferogram data; and generating a background noise level based on said interferogram data and at least one measure of interferogram quality.
Public/Granted literature
- US20090296097A1 Systems and Methods for Comparative Interferogram Spectrometry Public/Granted day:2009-12-03
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