发明授权
- 专利标题: Calibration apparatus, calibration method, program for calibration, and calibration jig
- 专利标题(中): 校准装置,校准方法,校准程序和校准夹具
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申请号: US10740348申请日: 2003-12-18
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公开(公告)号: US07894661B2公开(公告)日: 2011-02-22
- 发明人: Akio Kosaka , Kazuhiko Arai , Takashi Miyoshi , Kazuhiko Takahashi , Hidekazu Iwaki
- 申请人: Akio Kosaka , Kazuhiko Arai , Takashi Miyoshi , Kazuhiko Takahashi , Hidekazu Iwaki
- 申请人地址: JP Tokyo
- 专利权人: Olympus Corporation
- 当前专利权人: Olympus Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Scully, Scott, Murphy & Presser, P.C.
- 优先权: JP2002-382225 20021227
- 主分类号: G06K9/00
- IPC分类号: G06K9/00
摘要:
A calibration apparatus which estimates a calibration parameter of an image acquisition apparatus, comprises a calibration jig which includes at least two planes and in which calibration markers having known three-dimensional positions are arranged in each plane based on a predetermined rule. The calibration apparatus further comprises a calibration marker recognition section configured to measure and number in-image positions of the calibration markers in at least one image obtained by photographing the calibration jig by the image acquisition apparatus, and a parameter estimate section configured to estimate the calibration parameters of the image acquisition apparatus by the use of the three-dimensional position and the in-image position of the calibration markers numbered by the calibration marker recognition section.
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