发明授权
- 专利标题: Matrix system and method for debugging scan structure
- 专利标题(中): 用于调试扫描结构的矩阵系统和方法
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申请号: US12249317申请日: 2008-10-10
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公开(公告)号: US07895489B2公开(公告)日: 2011-02-22
- 发明人: Mohammad Jahidur Rahman
- 申请人: Mohammad Jahidur Rahman
- 申请人地址: US TX Dallas
- 专利权人: Texas Instruments Incorporated
- 当前专利权人: Texas Instruments Incorporated
- 当前专利权人地址: US TX Dallas
- 代理商 John R. Pessetto; W. James Brady; Frederick J. Telecky, Jr.
- 主分类号: G01R31/28
- IPC分类号: G01R31/28
摘要:
An aspect of the present invention is drawn to a system that includes an automatic test engine, a decompressor, a first scan chain, a second scan chain, a compactor and a debug output. The automatic test engine is operable to output a test output, to receive a resultant input, to receive a debug input, to monitor the debug input and to compare the test output with the resultant input. The decompressor is arranged to receive a decompressor input based on the test output, to output a decompressor output. The scan chains are arranged to receive input based on the decompressor output, and each scan chain includes at least one flip-flop. The compactor is arranged to receive input based output from the flip-flops, and to output a compactor output. The debug output line is arranged to receive the flip-flop output.
公开/授权文献
- US20100095173A1 MATRIX SYSTEM AND METHOD FOR DEBUGGING SCAN STRUCTURE 公开/授权日:2010-04-15
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