发明授权
US07904868B2 Structures including means for lateral current carrying capability improvement in semiconductor devices
有权
结构包括用于半导体器件中横向电流承载能力改进的装置
- 专利标题: Structures including means for lateral current carrying capability improvement in semiconductor devices
- 专利标题(中): 结构包括用于半导体器件中横向电流承载能力改进的装置
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申请号: US11873711申请日: 2007-10-17
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公开(公告)号: US07904868B2公开(公告)日: 2011-03-08
- 发明人: Natalie Barbara Feilchenfeld , Zhong-Xiang He , Qizhi Liu , BethAnn Rainey , Ping-Chuan Wang , Kimball M. Watson
- 申请人: Natalie Barbara Feilchenfeld , Zhong-Xiang He , Qizhi Liu , BethAnn Rainey , Ping-Chuan Wang , Kimball M. Watson
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理机构: Schmeiser, Olsen & Watts
- 代理商 Richard M. Kotulak
- 主分类号: G06F17/50
- IPC分类号: G06F17/50
摘要:
A design structure including a semiconductor structure. The semiconductor structure includes (a) a substrate; (b) a first semiconductor device on the substrate; (c) N ILD (Inter-Level Dielectric) layers on the first semiconductor device, wherein N is an integer greater than one; and (d) an electrically conductive line electrically coupled to the first semiconductor device. The electrically conductive line is adapted to carry a lateral electric current in a lateral direction parallel to an interfacing surface between two consecutive ILD layers of the N ILD layers. The electrically conductive line is present in at least two ILD layers of the N ILD layers. The electrically conductive line does not comprise an electrically conductive via that is adapted to carry a vertical electric current in a vertical direction perpendicular to the interfacing surface.
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