发明授权
- 专利标题: Shape measuring apparatus
- 专利标题(中): 形状测量仪
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申请号: US12219285申请日: 2008-07-18
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公开(公告)号: US07907288B2公开(公告)日: 2011-03-15
- 发明人: Kazuhiko Kawasaki , Satoshi Koga , Yoshimasa Suzuki
- 申请人: Kazuhiko Kawasaki , Satoshi Koga , Yoshimasa Suzuki
- 申请人地址: JP Kawasaki-shi
- 专利权人: Mitutoyo Corporation
- 当前专利权人: Mitutoyo Corporation
- 当前专利权人地址: JP Kawasaki-shi
- 代理机构: Oliff & Berridge, PLC
- 优先权: JP2007-188070 20070719
- 主分类号: G01B5/28
- IPC分类号: G01B5/28 ; G01B11/02
摘要:
A shape measuring apparatus includes a probe for scanning across a surface to be measured, while vibrating up and down; a minute-vibration generation section for vibrating the probe up and down; a vertical movement control section for moving the probe up and down to keep a constant contact force or a constant distance between the surface to be measured and the probe; a scanning section for scanning the surface to be measured with the probe; a displacement sensor for measuring the vertical displacement of the probe and outputting a probe displacement signal; and a signal processing section for obtaining information about the contact force or the distance between the surface to be measured and the probe from a high-frequency component of the probe displacement signal, and for obtaining information about profile of the surface to be measured from a low-frequency component of the signal obtained when the surface to be measured is scanned such that the distance or the contact force is kept constant.
公开/授权文献
- US20090021747A1 Shape measuring apparatus 公开/授权日:2009-01-22
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