Invention Grant
- Patent Title: Apparatus and method of transporting and loading probe devices of a metrology instrument
- Patent Title (中): 运输和加载计量仪器探头装置的装置和方法
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Application No.: US12058996Application Date: 2008-03-31
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Publication No.: US07908909B2Publication Date: 2011-03-22
- Inventor: Adam J. Feinstein , Matthew R. Wilson
- Applicant: Adam J. Feinstein , Matthew R. Wilson
- Applicant Address: US AZ Tucson
- Assignee: Bruker Nano, Inc.
- Current Assignee: Bruker Nano, Inc.
- Current Assignee Address: US AZ Tucson
- Agency: Boyle Fredrickson, S.C.
- Main IPC: G01D11/24
- IPC: G01D11/24

Abstract:
The preferred embodiments are directed to a probe cassette for a scanning probe microscope that includes a base having at least one probe storage receptacle, a lid mountable on the base with the probe storage receptacle at least substantially covering the at least one receptacle, and a probe retainer that retains a probe device of the scanning probe microscope in the receptacle under a compressive force. The probe cassette can be pre-loaded and shipped to a user site where the cassette can be loaded in an AFM without manual manipulation of the individual probe devices.
Public/Granted literature
- US20080179206A1 APPARATUS AND METHOD OF TRANSPORTING AND LOADING PROBE DEVICES OF A METROLOGY INSTRUMENT Public/Granted day:2008-07-31
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