Invention Grant
- Patent Title: Antifuse programming circuit with snapback select transistor
- Patent Title (中): 具有快速恢复选择晶体管的防腐编程电路
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Application No.: US11421614Application Date: 2006-06-01
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Publication No.: US07915916B2Publication Date: 2011-03-29
- Inventor: William J. Wilcox , James C. Davis , Dwayne K. Kreipl , Michael B. Pearson
- Applicant: William J. Wilcox , James C. Davis , Dwayne K. Kreipl , Michael B. Pearson
- Applicant Address: US ID Bosie
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Bosie
- Agency: Dorsey & Whitney LLP
- Main IPC: G06F7/38
- IPC: G06F7/38 ; H03K19/173 ; H03K19/094 ; G11C17/00 ; G11C17/18

Abstract:
An antifuse circuit includes a terminal, an antifuse, and a select transistor. The antifuse is coupled to the terminal and has an associated program voltage. The select transistor is coupled to the antifuse and has a gate terminal coupled to receive a first select signal. The select transistor operates in a snapback mode of operation in response to an assertion of the first select signal and the program voltage at the terminal.
Public/Granted literature
- US20070279086A1 ANTIFUSE PROGRAMMING CIRCUIT WITH SNAPBACK SELECT TRANSISTOR Public/Granted day:2007-12-06
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