发明授权
US07922919B2 Crossbar-array designs and wire addressing methods that tolerate misalignment of electrical components at wire overlap points
有权
横线阵列设计和线寻址方法,可以容忍电线重叠点处的电气元件的未对准
- 专利标题: Crossbar-array designs and wire addressing methods that tolerate misalignment of electrical components at wire overlap points
- 专利标题(中): 横线阵列设计和线寻址方法,可以容忍电线重叠点处的电气元件的未对准
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申请号: US11906886申请日: 2007-10-03
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公开(公告)号: US07922919B2公开(公告)日: 2011-04-12
- 发明人: Wei Wu , Philip J. Kuekes , R. Stanley Williams
- 申请人: Wei Wu , Philip J. Kuekes , R. Stanley Williams
- 申请人地址: US TX Houston
- 专利权人: Hewlett-Packard Development Company, L.P.
- 当前专利权人: Hewlett-Packard Development Company, L.P.
- 当前专利权人地址: US TX Houston
- 主分类号: H01B13/00
- IPC分类号: H01B13/00
摘要:
Various embodiments of the present invention are directed to crossbar array designs that interfaces wires to address wires, despite misalignments between electrical components and wires. In one embodiment, a nanoscale device may be composed of a first layer of two or more wires and a second layer of two or more address wires that overlays the first layer. The nanoscale device may also include an intermediate layer positioned between the first layer and the second layer. Two or more redundant electrical component patterns may be fabricated within the intermediate layer so that one or more of the electrical component patterns is aligned with the first and second layers.
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