发明授权
- 专利标题: Method and apparatus for mass spectrometry
- 专利标题(中): 质谱法和方法
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申请号: US11319611申请日: 2005-12-29
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公开(公告)号: US07928365B2公开(公告)日: 2011-04-19
- 发明人: Fujio Oonishi , Kenichi Shinbo , Ritsuro Orihashi , Yasushi Terui , Tsukasa Shishika
- 申请人: Fujio Oonishi , Kenichi Shinbo , Ritsuro Orihashi , Yasushi Terui , Tsukasa Shishika
- 申请人地址: JP Tokyo
- 专利权人: Hitachi High-Technologies Corporation
- 当前专利权人: Hitachi High-Technologies Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Antonelli, Terry, Stout & Kraus, LLP.
- 优先权: JP2005-050102 20050225
- 主分类号: H01J49/00
- IPC分类号: H01J49/00
摘要:
For the achievement of data transfer time reduction, removal of noise data, and analytical efficiency improvement in an ADC data processing function of a time-of-flight mass spectrometer, the mass spectrometer comprises a data acquisition circuit including: an A/D converter; a signal intensity addition memory that stores data of ion signals such as a time range and the number of measurements and performs an addition process; a voltage value frequency addition memory that performs an addition process of frequencies of voltage values of the predetermined time range and the number of measurements and stores addition results; a threshold level computation circuit that computes a predetermined threshold level from the results in the memory; a compression memory that extracts only data exceeding the threshold level from the data in the signal intensity addition memory; and a counter that controls a measurement time for data acquisition and the operation of each circuit.
公开/授权文献
- US20060248942A1 Method and apparatus for mass spectrometry 公开/授权日:2006-11-09
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