Invention Grant
- Patent Title: Method of calibrating a test chart and a scanning device
- Patent Title (中): 校准测试图和扫描设备的方法
-
Application No.: US11882440Application Date: 2007-08-01
-
Publication No.: US07940430B2Publication Date: 2011-05-10
- Inventor: Ming-Hsien Hsieh , Sheng Peng Hsu , Chin Ping Yang
- Applicant: Ming-Hsien Hsieh , Sheng Peng Hsu , Chin Ping Yang
- Applicant Address: TW
- Assignee: Avision Inc.
- Current Assignee: Avision Inc.
- Current Assignee Address: TW
- Priority: TW95128421A 20060803
- Main IPC: H04N1/04
- IPC: H04N1/04

Abstract:
A method of calibrating a test chart is provided. First, a reference scanning device scans a reference test chart to obtain a plurality of reference optical density (OD) values. The reference test chart includes a plurality of reference blocks. Then, the reference scanning device scans a test chart to obtain a plurality of first OD values. The test chart includes a plurality of blocks, which corresponds to the reference blocks. Next, a compensation function derived from respectively converting the first OD values into the reference OD values is obtained.
Public/Granted literature
- US20080030795A1 Method of calibrating a test chart and a scanning device Public/Granted day:2008-02-07
Information query