发明授权
US07940595B2 Power up detection system for a memory device 有权
用于存储设备的上电检测系统

  • 专利标题: Power up detection system for a memory device
  • 专利标题(中): 用于存储设备的上电检测系统
  • 申请号: US12306940
    申请日: 2007-12-20
  • 公开(公告)号: US07940595B2
    公开(公告)日: 2011-05-10
  • 发明人: Wlodek Kurjanowicz
  • 申请人: Wlodek Kurjanowicz
  • 申请人地址: CA Ottawa
  • 专利权人: Sidense Corp.
  • 当前专利权人: Sidense Corp.
  • 当前专利权人地址: CA Ottawa
  • 代理机构: Borden Ladner Gervais LLP
  • 代理商 Shin Hung
  • 国际申请: PCT/CA2007/002316 WO 20071220
  • 国际公布: WO2008/077243 WO 20080703
  • 主分类号: G11C7/00
  • IPC分类号: G11C7/00
Power up detection system for a memory device
摘要:
A power up detection system for a memory device. Two rows of memory cells are mask programmed to include a word of data having an arbitrary size. The word in the second row is a single-bit shifted version of the word in the first row, such that each bit is shifted one bit position in a predetermined direction. The bits of the first word are read from the first row into slave latches of the register stages of a data register, and then shifted into the master latches of the next register stage of the data register. The bits of the second word are read from the second row into the slave latches of the register stages. Data comparison logic compares data stored in the master and slave latches of each register stage, and provides a signal indicating matching data between the first latches and the second latches, thereby indicating successful power up of the memory device.
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