发明授权
- 专利标题: Semiconductor integrated circuit
- 专利标题(中): 半导体集成电路
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申请号: US11795842申请日: 2006-01-05
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公开(公告)号: US07945829B2公开(公告)日: 2011-05-17
- 发明人: Kazuteru Nanba , Hideo Ito
- 申请人: Kazuteru Nanba , Hideo Ito
- 申请人地址: JP Chiba
- 专利权人: National University Corporation Chiba University
- 当前专利权人: National University Corporation Chiba University
- 当前专利权人地址: JP Chiba
- 代理机构: Knobbe Martens Olson & Bear LLP
- 优先权: JP2005-012119 20050119
- 国际申请: PCT/JP2006/000022 WO 20060105
- 国际公布: WO2006/077746 WO 20060727
- 主分类号: G01R31/28
- IPC分类号: G01R31/28
摘要:
[PROBLEMS] To provide a semiconductor integrated circuit by which what has been referred to as two-pattern test is made possible without greatly increasing an occupying area. [MEANS FOR SOLVING PROBLEMS] The semiconductor integrated circuit is provided with a plurality of flip-flop circuits and selectors corresponding to each flip-flop circuit. Each flip-flop circuit is provided with a master latch and a slave latch connected to the master latch. The selector is electrically connected with the master latch of the flip-flop circuit to which the selector corresponds, and is also connected with the master latch of the flip-flop circuit other than the one to which the selector corresponds.
公开/授权文献
- US20090102531A1 Semiconductor Integrated Circuit 公开/授权日:2009-04-23