发明授权
US07947795B2 Polymer for filling gaps in semiconductor substrate and coating composition using the same
有权
用于填充半导体衬底中的间隙的聚合物和使用其的涂料组合物
- 专利标题: Polymer for filling gaps in semiconductor substrate and coating composition using the same
- 专利标题(中): 用于填充半导体衬底中的间隙的聚合物和使用其的涂料组合物
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申请号: US11474231申请日: 2006-06-23
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公开(公告)号: US07947795B2公开(公告)日: 2011-05-24
- 发明人: Hyun Hoo Sung , Jong Seob Kim , Sun Yul Lee , Seung Bae Oh , Dae Yun Kim
- 申请人: Hyun Hoo Sung , Jong Seob Kim , Sun Yul Lee , Seung Bae Oh , Dae Yun Kim
- 申请人地址: KR Gumi-si
- 专利权人: Cheil Industries Inc.
- 当前专利权人: Cheil Industries Inc.
- 当前专利权人地址: KR Gumi-si
- 代理机构: Summa, Addition & Ashe, P.A.
- 优先权: KR10-2005-0104325 20051102; KR10-2005-0117592 20051205
- 主分类号: C08F220/10
- IPC分类号: C08F220/10
摘要:
A polymer for filling gaps in a semiconductor substrate and a composition using the polymer are provided. According to the composition, holes having a diameter of 100 nm or less and an aspect ratio (i.e. a ratio between the diameter and height of the holes) of 1 or higher in semiconductor substrates can be substantially completely filled by common spin coating without formation of defects, e.g., air voids, the film can be dissolved by an aqueous alkaline solution (i.e. a developing solution) until a desired thickness is reached, the film is highly resistant to isopropyl alcohol (IPA) and plasma etching after curing by baking, and residue can be rapidly removed from the inside of the holes by ashing.
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