Invention Grant
- Patent Title: Semiconductor device having different metal gate structures
- Patent Title (中): 具有不同金属栅极结构的半导体器件
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Application No.: US11946153Application Date: 2007-11-28
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Publication No.: US07952118B2Publication Date: 2011-05-31
- Inventor: Hyung-suk Jung , Jong-ho Lee , Sung-kee Han , Ha-jin Lim
- Applicant: Hyung-suk Jung , Jong-ho Lee , Sung-kee Han , Ha-jin Lim
- Applicant Address: KR Suwon-si, Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-si, Gyeonggi-do
- Agency: Volentine & Whitt, P.L.L.C.
- Priority: KR10-2003-0079908 20031112; KR10-2005-0072331 20050808; KR10-2007-0000684 20070103
- Main IPC: H01L29/78
- IPC: H01L29/78

Abstract:
A semiconductor includes a channel region in a semiconductor substrate, a gate dielectric film on the channel region, and a gate on the gate dielectric film. The gate includes a doped metal nitride film, formed from a nitride of a first metal and doped with a second metal which is different from the first metal, and a conductive polysilicon layer formed on the doped metal nitride film. The gate may further include a metal containing capping layer interposed between the doped metal nitride film and the conductive polysilicon layer.
Public/Granted literature
- US20080067606A1 SEMICONDUCTOR DEVICE HAVING DIFFERENT METAL GATE STRUCTURES Public/Granted day:2008-03-20
Information query
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