发明授权
US07955777B2 Compound, acid generator, resist composition and method of forming resist pattern
有权
化合物,酸发生剂,抗蚀剂组合物和形成抗蚀剂图案的方法
- 专利标题: Compound, acid generator, resist composition and method of forming resist pattern
- 专利标题(中): 化合物,酸发生剂,抗蚀剂组合物和形成抗蚀剂图案的方法
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申请号: US12327549申请日: 2008-12-03
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公开(公告)号: US07955777B2公开(公告)日: 2011-06-07
- 发明人: Takehiro Seshimo , Yoshiyuki Utsumi , Yoshitaka Komuro , Keita Ishiduka , Akiya Kawaue , Kyoko Ohshita
- 申请人: Takehiro Seshimo , Yoshiyuki Utsumi , Yoshitaka Komuro , Keita Ishiduka , Akiya Kawaue , Kyoko Ohshita
- 申请人地址: JP Kawasaki-shi
- 专利权人: Tokyo Ohka Kogyo Co., Ltd.
- 当前专利权人: Tokyo Ohka Kogyo Co., Ltd.
- 当前专利权人地址: JP Kawasaki-shi
- 代理机构: Knobbe, Martens, Olson & Bear, LLP
- 优先权: JP2007-315239 20071205
- 主分类号: G03F7/00
- IPC分类号: G03F7/00 ; G03F7/004
摘要:
There are provided a compound represented by a general formula (b1-1) shown below suitable as an acid generator for a resist composition, a compound represented by a general formula (I) shown below suitable as a precursor for the compound represented by the general formula (b1-1), an acid generator, a resist composition, and a method of forming a resist pattern.[Chemical Formula 1] X—Q1—Y1—SO3−M+ (I) X—Q1—Y1—SO3−A+ (b1-1) (wherein, Q1 represents a bivalent linking group or a single bond; Y1 represents an alkylene group which may contain a substituent group or a fluorinated alkylene group which may contain a substituent group; X represents an aromatic cyclic group of 5 to 30 carbon atoms which contains a fluorine atom and may contain a substituent group; M+ represents an alkali metal ion; and A+ represents an organic cation.).
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