Invention Grant
- Patent Title: True amplitude transient electromagnetic system response measurement
- Patent Title (中): 真振幅瞬变电磁系统响应测量
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Application No.: US11886378Application Date: 2005-12-13
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Publication No.: US07957904B2Publication Date: 2011-06-07
- Inventor: Anton Ziolkowski , Bruce Hobbs , Graham Dawes , David Wright
- Applicant: Anton Ziolkowski , Bruce Hobbs , Graham Dawes , David Wright
- Applicant Address: GB Edinburgh
- Assignee: MTEM Ltd.
- Current Assignee: MTEM Ltd.
- Current Assignee Address: GB Edinburgh
- Agent E. Eugene Thigpen; Shannon Powers
- Priority: GB0505160.2 20050314
- International Application: PCT/GB2005/004773 WO 20051213
- International Announcement: WO2006/114561 WO 20061102
- Main IPC: G01V1/40
- IPC: G01V1/40 ; H04B15/00

Abstract:
A method for mapping sub-surface resistivity contrasts comprising making multi-channel transient electromagnetic (MTEM) measurements using at least one electric source with grounded input current electrodes or one magnetic source with current in a wire loop or multi loop and at least one electric field or magnetic field receiver, measuring the resultant earth response simultaneously at each receiver using a known recording system, measuring the system response by measuring directly the current in the wire at the source using effectively the same recording system, using the measured system response to recover the impulse response of the earth from each measured earth response, and creating from such impulse responses a sub-surface representation of resistivity contrasts.
Public/Granted literature
- US20090216454A1 True Amplitude Transient Electromagnetic System Response Measurement Public/Granted day:2009-08-27
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