Invention Grant
- Patent Title: Method and apparatus for inspecting radio frequency identification tags
- Patent Title (中): 用于检查射频识别标签的方法和装置
-
Application No.: US11944596Application Date: 2007-11-23
-
Publication No.: US07973646B2Publication Date: 2011-07-05
- Inventor: Hui-Ta Chen , Guo-Shing Huang , Ching-Chih Lin , Chun-Hao Chang , Chuan-Sheng Zhuang , Ming-Hsien Ko , Chih-Hung Kao
- Applicant: Hui-Ta Chen , Guo-Shing Huang , Ching-Chih Lin , Chun-Hao Chang , Chuan-Sheng Zhuang , Ming-Hsien Ko , Chih-Hung Kao
- Applicant Address: TW Hsin-Chu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsin-Chu
- Agency: WPAT, PC
- Agent Justin King
- Priority: TW96102602A 20070124
- Main IPC: H04Q5/22
- IPC: H04Q5/22

Abstract:
A method and an apparatus for inspecting radio frequency identification (RFID) tags which utilize a way of shielding for inspecting whether RFID tags function properly or not. The method of the present invention comprises steps of: reading a plurality of RFID tags in a readable zone; and determining whether there is any malfunctional RFID tag in the plurality of RFID tags. If all the plurality of RFID tags function properly, the method will check a next plurality of RFID tags. If there is at least one unreadable RFID tag, the at least one malfunctional RFID tag will be found by shielding one or the plurality of RFID tags. By means of the disclosure in the present invention, the present method and apparatus are capable of improving the efficiency during inspection and simplifying the design of a readable zone.
Public/Granted literature
- US20080174407A1 METHOD AND APPARATUS FOR INSPECTING RADIO FREQUENCY IDENTIFICATION TAGS Public/Granted day:2008-07-24
Information query