发明授权
US07977982B2 Semiconductor integrated circuit, test method and electronic information device
失效
半导体集成电路,测试方法和电子信息设备
- 专利标题: Semiconductor integrated circuit, test method and electronic information device
- 专利标题(中): 半导体集成电路,测试方法和电子信息设备
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申请号: US11359556申请日: 2006-02-23
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公开(公告)号: US07977982B2公开(公告)日: 2011-07-12
- 发明人: Tetsuya Akamatsu , Hideki Shioe , Haruya Mori
- 申请人: Tetsuya Akamatsu , Hideki Shioe , Haruya Mori
- 申请人地址: JP Osaka-shi, Osaka
- 专利权人: Sharp Kabushiki Kaisha
- 当前专利权人: Sharp Kabushiki Kaisha
- 当前专利权人地址: JP Osaka-shi, Osaka
- 代理机构: Harness, Dickey & Pierce, PLC
- 优先权: JP2005-047925 20050223
- 主分类号: H03L7/00
- IPC分类号: H03L7/00
摘要:
A semiconductor integrated circuit, including: a logic section; an initiating current generating section for generating initiating current for initiating or re-initiating a circuit when the circuit is to be initiated or the circuit operates abnormally; an initiating current detecting section for detecting the initiating current of the initiating current generating section and outputting a detection signal indicating whether or not the initiating current generating section operates normally; and a signal selection section for selecting one of the detection signal and an output from the logic section based on an internal signal of the logic section which is controllable from outside of the logic section, and outputting the selected one to a terminal.
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