发明授权
US07977982B2 Semiconductor integrated circuit, test method and electronic information device 失效
半导体集成电路,测试方法和电子信息设备

Semiconductor integrated circuit, test method and electronic information device
摘要:
A semiconductor integrated circuit, including: a logic section; an initiating current generating section for generating initiating current for initiating or re-initiating a circuit when the circuit is to be initiated or the circuit operates abnormally; an initiating current detecting section for detecting the initiating current of the initiating current generating section and outputting a detection signal indicating whether or not the initiating current generating section operates normally; and a signal selection section for selecting one of the detection signal and an output from the logic section based on an internal signal of the logic section which is controllable from outside of the logic section, and outputting the selected one to a terminal.
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