发明授权
- 专利标题: Quantum interference transistors and methods of manufacturing and operating the same
- 专利标题(中): 量子干涉晶体管及其制造和操作方法
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申请号: US12585724申请日: 2009-09-23
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公开(公告)号: US07978006B2公开(公告)日: 2011-07-12
- 发明人: Jai-kwang Shin , Sun-ae Seo , Jong-seob Kim , Ki-ha Hong , Hyun-jong Chung
- 申请人: Jai-kwang Shin , Sun-ae Seo , Jong-seob Kim , Ki-ha Hong , Hyun-jong Chung
- 申请人地址: KR Gyeonggi-do
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Gyeonggi-do
- 代理机构: Harness, Dickey & Pierce, P.L.C.
- 优先权: KR10-2008-0099353 20081009
- 主分类号: H01L25/00
- IPC分类号: H01L25/00
摘要:
A quantum interference transistor may include a source; a drain; N channels (N≧2), between the source and the drain, and having N−1 path differences between the source and the drain; and at least one gate disposed at one or more of the N channels. One or more of the N channels may be formed in a graphene sheet. A method of manufacturing the quantum interference transistor may include forming one or more of the N channels using a graphene sheet. A method of operating the quantum interference transistor may include applying a voltage to the at least one gate. The voltage may shift a phase of a wave of electrons passing through a channel at which the at least one gate is disposed.
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