Invention Grant
- Patent Title: Vision inspection system device and method
- Patent Title (中): 视觉检测系统装置及方法
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Application No.: US12107579Application Date: 2008-04-22
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Publication No.: US07978328B2Publication Date: 2011-07-12
- Inventor: Roger W. Engelbart , Reed Hannebaum , Tim Pollock
- Applicant: Roger W. Engelbart , Reed Hannebaum , Tim Pollock
- Applicant Address: US IL Chicago
- Assignee: The Boeing Company
- Current Assignee: The Boeing Company
- Current Assignee Address: US IL Chicago
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
A course material that is applied to a substrate during fabrication of a composite item is inspected by a system that includes a vision assembly. The vision assembly includes an area light, a line generator, a sensor, and an image processor. The area light illuminates an area of the course material. The line generator generates a line of illumination across the area. The sensor captures an image of the area. The image processor analyzes the image. The image processor is configured to identify debris on the course material in response to the area light being activated and the image processor is configured to identify placement aberrations in response to the line generator being activated.
Public/Granted literature
- US20080259325A1 VISION INSPECTION SYSTEM DEVICE AND METHOD Public/Granted day:2008-10-23
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