Invention Grant
- Patent Title: Method for manufacturing nonvolatile storage element and method for manufacturing nonvolatile storage device
- Patent Title (中): 非易失性存储元件的制造方法及其制造方法
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Application No.: US12669812Application Date: 2009-05-07
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Publication No.: US07981760B2Publication Date: 2011-07-19
- Inventor: Yoshio Kawashima , Takumi Mikawa , Takeshi Takagi , Koji Arita
- Applicant: Yoshio Kawashima , Takumi Mikawa , Takeshi Takagi , Koji Arita
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, LLP.
- Priority: JP2008-121948 20080508
- International Application: PCT/JP2009/001994 WO 20090507
- International Announcement: WO2009/136493 WO 20091112
- Main IPC: H01L21/00
- IPC: H01L21/00

Abstract:
A method for manufacturing a nonvolatile storage element that minimizes shape shift between an upper electrode and a lower electrode, and which includes: depositing, in sequence, a connecting electrode layer which is conductive, a lower electrode layer and a variable resistance layer which are made of a non-noble metal nitride and are conductive, an upper electrode layer made of noble metal, and a mask layer; forming the mask layer into a predetermined shape; forming the upper electrode layer, the variable resistance layer, and the lower electrode layer into the predetermined shape by etching using the mask layer as a mask; and removing, simultaneously, the mask and a region of the connecting electrode layer that has been exposed by the etching.
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