Invention Grant
- Patent Title: Creation of dielectrically insulating soi-technlogical trenches comprising rounded edges for allowing higher voltages
- Patent Title (中): 创建介质绝缘的技术沟槽,包括用于允许更高电压的圆形边缘
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Application No.: US10599726Application Date: 2005-04-07
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Publication No.: US07989308B2Publication Date: 2011-08-02
- Inventor: Ralf Lerner , Uwe Eckoldt , Thomas Oetzel
- Applicant: Ralf Lerner , Uwe Eckoldt , Thomas Oetzel
- Applicant Address: DE Erfurt
- Assignee: X-FAB Semiconductor Foundries AG
- Current Assignee: X-FAB Semiconductor Foundries AG
- Current Assignee Address: DE Erfurt
- Agency: Duane Morris LLP
- Priority: DE102004017073 20040407
- International Application: PCT/DE2005/000618 WO 20050407
- International Announcement: WO2005/098936 WO 20051020
- Main IPC: H01L27/12
- IPC: H01L27/12

Abstract:
The aim of the invention is to integrate low-voltage logic elements and high-voltage power elements in one and the same silicon circuit. Said aim is achieved by dielectrically chip regions having different potentials from each other with the aid of isolation trenches (10). In order to prevent voltage rises at sharp edges on the bottom of the isolation trenches, said edges are rounded in a simple process, part of the insulating layer (2) being isotropically etched.
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