发明授权
US07992348B2 High-frequency measuring enclosure for measuring large test objects
有权
用于测量大型测试对象的高频测量机箱
- 专利标题： High-frequency measuring enclosure for measuring large test objects
- 专利标题（中）： 用于测量大型测试对象的高频测量机箱
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申请号： US12095436申请日： 2006-11-30
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公开(公告)号： US07992348B2公开(公告)日： 2011-08-09
- 发明人: Torsten Fritzel , Hans-Juergen Steiner
- 申请人： Torsten Fritzel , Hans-Juergen Steiner
- 申请人地址： DE Taufkirchen
- 专利权人： Astrium GmbH
- 当前专利权人： Astrium GmbH
- 当前专利权人地址： DE Taufkirchen
- 代理机构： Crowell & Moring LLP
- 优先权： DE102005057403 20051130; DE102006056998 20061130
- 国际申请： PCT/EP2006/011493 WO 20061130
- 国际公布： WO2007/062839 WO 20070607
- 主分类号： G01R29/08
- IPC分类号： G01R29/08 ; E04H5/02 ; H01Q17/00
摘要：
A high-frequency measuring enclosure for measuring large test objects is formed by an air-supported membrane or textile construction of a spherical or ellipsoidal contour, which is substantially pervious to electromagnetic radiation. For absorption of residual electromagnetic radiation that may be reflected by the interior of the surface, the floor is covered with absorber material.
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