发明授权
US07996813B2 Method for generating pattern, method for manufacturing semiconductor device, semiconductor device, and computer program 有权
用于生成图案的方法,制造半导体器件的方法,半导体器件和计算机程序

Method for generating pattern, method for manufacturing semiconductor device, semiconductor device, and computer program
摘要:
A method for generating a pattern includes reading out an interconnect layout and a hole layout, the interconnect layout prescribing interconnect patterns, the hole layout prescribing hole patterns configured to connect to the interconnect patterns; extracting one of the hole patterns to be connected within the same interconnect layer level to one of the interconnect patterns in a pattern processing area; extracting a first processing area including the extracted hole pattern; calculating a first pattern density of the interconnect patterns included in the first processing area; and generating first additional patterns in the first processing area based on the first pattern density.
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