Invention Grant
US08000676B2 Second intercept point (IP2) calibrator and method for calibrating IP2
失效
第二拦截点(IP2)校准器和校准IP2的方法
- Patent Title: Second intercept point (IP2) calibrator and method for calibrating IP2
- Patent Title (中): 第二拦截点(IP2)校准器和校准IP2的方法
-
Application No.: US11942875Application Date: 2007-11-20
-
Publication No.: US08000676B2Publication Date: 2011-08-16
- Inventor: Hyun-Seok Kim , Woo-Nyun Kim
- Applicant: Hyun-Seok Kim , Woo-Nyun Kim
- Applicant Address: KR Suwon-Si
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Suwon-Si
- Agency: F. Chau & Associates, LLC
- Priority: KR10-2006-0116009 20061122
- Main IPC: H04B1/26
- IPC: H04B1/26

Abstract:
A second intercept point (IP2) calibrator and a method for calibrating IP2 are disclosed. The IP2 calibrator and the method for calibrating IP2 remove any direct current (DC) offset by comparing a common-mode reference voltage with the common-mode voltage measured between a first output terminal and a second output terminal of a mixer, and calibrates the IP2 of the mixer by comparing the common-mode voltage with a calibration reference voltage. The calibration reference voltage is independent of the common-mode reference voltage and may be a quantized variable voltage generated according to digital control code.
Public/Granted literature
- US20080116902A1 SECOND INTERCEPT POINT (IP2) CALIBRATOR AND METHOD FOR CALIBRATING IP2 Public/Granted day:2008-05-22
Information query