发明授权
- 专利标题： Manufacturing instruction evaluation support system, manufacturing instruction evaluation support method, and manufacturing instruction evaluation support program
- 专利标题（中）： 制造指导评估支持系统，制造指导评估支持方法和制造指导评估支持计划
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申请号： US12392513申请日： 2009-02-25
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公开(公告)号： US08000819B2公开(公告)日： 2011-08-16
- 发明人: Shinichirou Hanawa , Isao Nakamura , Akiko Tadokoro , Atsunori Hotehama , Yukiko Yamamoto , Haruo Umeki , Akihiro Kondo , Youichi Hamamoto , Kouichi Hiraoka
- 申请人： Shinichirou Hanawa , Isao Nakamura , Akiko Tadokoro , Atsunori Hotehama , Yukiko Yamamoto , Haruo Umeki , Akihiro Kondo , Youichi Hamamoto , Kouichi Hiraoka
- 申请人地址： JP Tokyo
- 专利权人： Hitachi, Ltd.
- 当前专利权人： Hitachi, Ltd.
- 当前专利权人地址： JP Tokyo
- 代理机构： Brundidge & Stanger, P.C.
- 优先权： JP2008-133461 20080521
- 主分类号： G06F19/00
- IPC分类号： G06F19/00 ; G06Q10/00
摘要：
A manufacturing instruction evaluation support system includes a data reading part that reads a manufacturing instruction parameter group and manufacturing performance data corresponding thereto, a parameter sorting part that calculates a risk rate for each manufacturing instruction parameter configuring the manufacturing instruction parameter group and an average value of risk rates among the manufacturing instruction parameters to identify as available choices the manufacturing instruction parameters having the risk rates no greater than the average value, a parameter identifying part that calculates an explanatory variable selection reference value for the manufacturing instruction parameter group and the manufacturing instruction parameters of the available choices with the multiple regression analysis program to identify the manufacturing instruction parameter group or the manufacturing instruction parameters of the available choices having the greater calculated explanatory variable selection reference value as optimum parameters, and a regression equation calculating part that calculates and displays a regression equation when employing the optimum parameters with the multiple regression analysis program.