发明授权
- 专利标题: Exposure apparatus, control method for the same, and device manufacturing method
- 专利标题(中): 曝光装置,其控制方法和装置制造方法
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申请号: US11677241申请日: 2007-02-21
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公开(公告)号: US08004657B2公开(公告)日: 2011-08-23
- 发明人: Masayuki Tanabe , Yutaka Watanabe , Shigeru Terashima , Mika Kanehira
- 申请人: Masayuki Tanabe , Yutaka Watanabe , Shigeru Terashima , Mika Kanehira
- 申请人地址: JP Tokyo
- 专利权人: Canon Kabushiki Kaisha
- 当前专利权人: Canon Kabushiki Kaisha
- 当前专利权人地址: JP Tokyo
- 代理机构: Fitzpatrick, Cella, Harper & Scinto
- 优先权: JP2006-053804 20060228
- 主分类号: F21V9/04
- IPC分类号: F21V9/04 ; G03B27/32 ; G03B27/42 ; G03B27/52 ; G03B27/54
摘要:
An exposure apparatus that includes a chamber in which an optical element, including a capping layer, is arranged, and that exposes a substrate to exposure light via the optical element. The apparatus includes a supply unit configured to supply a material into the chamber and a providing unit configured to provide electromagnetic waves to the capping layer. The apparatus is configured so that the electromagnetic waves provided by the providing unit cause a photochemical reaction of the material, to grow a layer on the capping layer, with at least one of a condition of supply of the material by the supply unit and a condition of provision of the electromagnetic waves by the providing unit being changed in accordance with each position of the capping layer, based on information of a decrease in an amount of the capping layer at each position, so as to repair the capping layer.
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