发明授权
US08018228B2 High resolution and flexible eddy current array probe 有权
高分辨率和灵活的涡流阵列探头

High resolution and flexible eddy current array probe
摘要:
Disclosed is a method and an NDT/NDI probe deploying a slit or a flexible joint of probe bending region, preferably between two rows of probe elements to allow free bending between rows of probe elements and along the direction of the rows of elements and to allow two adjacent rows of elements to bend individually along its own natural bending lines perpendicular to the direction of the rows of elements. Also disclosed is the use of protective flexible pads to cover the probe elements and other probe components.
公开/授权文献
信息查询
0/0