发明授权
- 专利标题: High resolution and flexible eddy current array probe
- 专利标题(中): 高分辨率和灵活的涡流阵列探头
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申请号: US12483649申请日: 2009-06-12
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公开(公告)号: US08018228B2公开(公告)日: 2011-09-13
- 发明人: Benoit Lepage , Denis Faucher
- 申请人: Benoit Lepage , Denis Faucher
- 申请人地址: US MA Waltham
- 专利权人: Olympus NDT
- 当前专利权人: Olympus NDT
- 当前专利权人地址: US MA Waltham
- 代理机构: Ostrolenk Faber LLP
- 主分类号: G01R33/12
- IPC分类号: G01R33/12 ; G01N27/82
摘要:
Disclosed is a method and an NDT/NDI probe deploying a slit or a flexible joint of probe bending region, preferably between two rows of probe elements to allow free bending between rows of probe elements and along the direction of the rows of elements and to allow two adjacent rows of elements to bend individually along its own natural bending lines perpendicular to the direction of the rows of elements. Also disclosed is the use of protective flexible pads to cover the probe elements and other probe components.
公开/授权文献
- US20100007342A1 HIGH RESOLUTION AND FLEXIBLE EDDY CURRENT ARRAY PROBE 公开/授权日:2010-01-14
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