公开(公告)号：US09952185B1

公开(公告)日：2018-04-24

申请号：US14790626

申请日：2015-07-02

申请人： Antoine Delhomme ,  Benoit Lepage

发明人： Antoine Delhomme ,  Benoit Lepage

IPC分类号： G10K15/00 ,  G01N29/30 ,  G01N29/07 ,  G01N29/26

CPC分类号： G01N29/30 ,  G01N29/07 ,  G01N29/262 ,  G01N29/4436

摘要： The method of validating a calibration of a phased-array inspection instrument uses a calibration block having two reflectors located below an inspection surface at two different depths. The method comprises: obtaining angle reference data associating expected angles with corrected angles, each corrected angle being usable to propagate a phased-array beam into the calibration block at a true angle relative to the inspection surface that corresponds to the corresponding expected angle; propagating, from the inspection surface and targeting each one of the two reflectors, phased-array beams into the calibration block at a true angle using the angle reference data, and measuring echo signals associated with the propagated phased-array beams; determining time-of-flight values corresponding to the reflection of the phased-array beams on the two reflectors using the echo signals; and validating the calibration of the phased-array inspection instrument using the time-of-flight values, the two different depths and the true angle.

公开(公告)号：US09032802B2

公开(公告)日：2015-05-19

申请号：US13750297

申请日：2013-01-25

申请人： Christophe Imbert ,  Jinchi Zhang ,  Benoit Lepage

发明人： Christophe Imbert ,  Jinchi Zhang ,  Benoit Lepage

IPC分类号： G01N29/27 ,  G01N29/26

CPC分类号： G01N29/27 ,  G01N29/262 ,  G01N2291/2634 ,  G01N2291/2675

摘要： A phased array system and the inspection method which is configured to inspect the weld seam of an HSAW for all standard types of flaws located both near pipe's internal and external surfaces in one scan pass, diminishing the need of making mechanical adjustment for the probes during the one pass of scan. The configuration includes the usage of at least one linear PA probe for Lamination inspection right above HAZ zone, at least one pair of PA probes for longitudinal defects inspection and holes detection and at least two pairs of PA probes for transversal defect inspections.

摘要翻译： 相控阵系统和检查方法，其被配置为在一次扫描过程中检查位于管内部和外部表面附近的所有标准类型的缺陷的HSAW的焊缝，减少了在探测期间对探针进行机械调节的需要 一次扫描。 该配置包括至少一个线性PA探针用于HAZ区域上方的层压检查，至少一对用于纵向缺陷检查和空穴检测的PA探针和用于横向缺陷检查的至少两对PA探针。

公开(公告)号：US08896300B2

公开(公告)日：2014-11-25

申请号：US12832620

申请日：2010-07-08

申请人： Benoit Lepage

发明人： Benoit Lepage

IPC分类号： G01N27/72 ,  G01N27/90

CPC分类号： G01N27/904 ,  G01N27/9006

摘要： The invention herein disclosed provides a 2D coil and a method of using the 2D wound EC sensor for reproducing the Eddy Current Testing (ECT) response of a prior art 3D orthogonal sensor. The 3D orthogonal sensor is conventionally wound onto a 3D core, with at least some of the surfaces being un-parallel to the surface be inspected. Using the herein disclosed 2D configuration allows the use of printed circuit board technologies for the manufacturing of these EC sensors. The herein disclosed method and the associated 2D EC sensors are particularly useful for reproducing the EC effect of conventional orthogonal probe arrays.

摘要翻译： 本文公开的本发明提供了2D线圈和使用2D缠绕EC传感器来再现现有技术3D正交传感器的涡流测试（ECT）响应的方法。 3D正交传感器通常缠绕在3D芯上，其中至少一些表面不平行于表面进行检查。 使用本文公开的2D配置允许使用印刷电路板技术来制造这些EC传感器。 本文公开的方法和相关联的2D EC传感器对于再现常规正交探针阵列的EC效应特别有用。

公开(公告)号：US08698778B2

公开(公告)日：2014-04-15

申请号：US13561333

申请日：2012-07-30

申请人： Jason Habermehl ,  Benoit Lepage ,  Tommy Bourgelas

发明人： Jason Habermehl ,  Benoit Lepage ,  Tommy Bourgelas

IPC分类号： G06F3/045

CPC分类号： G06F3/04845 ,  G01N27/90 ,  G06F3/04847 ,  G06F3/04883 ,  G06F2203/04808

摘要： A touch screen is disclosed which responds to a user's touch for re-drawing, re-scaling, re-translating and re-positioning an impedance plane signal received from non-destructive testing equipment, such as an eddy current sensor. The impedance plane is manipulated by slidingne, two or more fingers simultaneously to an end position to effectuate a complete re-drawing operation of the image.

摘要翻译： 公开了一种触摸屏，其响应用户的触摸以重新绘制，重新缩放，重新平移和重新定位从诸如涡流传感器的非破坏性测试设备接收的阻抗平面信号。 通过将两个或更多个手指同时滑动到结束位置来操纵阻抗平面，以实现图像的完全重绘操作。

公开(公告)号：US20140035568A1

公开(公告)日：2014-02-06

申请号：US13955078

申请日：2013-07-31

申请人： Benoit Lepage

发明人： Benoit Lepage

IPC分类号： G01N27/90

CPC分类号： G01N27/904 ,  G01N27/902

摘要： Disclosed is an ECA probes assembly capable of providing reliable and durable ECA inspections of dovetail slots without the use of an external guiding mechanism. The design combines a novel universal probe manipulator with a probe support suited for a wide range of probe supports which fit a rage of turbine disks. The probe support embodies a rigid yet expandable core, exerting a force pushing the array probe against the inner cavity of the dovetails. The pushing force is strategically located in critical areas of the dovetail leading to array probe to be self-guiding into the dovetail, and to provide optimum performance with consistent and stable lift-off.

摘要翻译： 公开了一种ECA探针组件，其能够在不使用外部引导机构的情况下提供对燕尾槽的可靠和持久的ECA检查。 该设计将新型通用探头操纵器与探头支架相结合，适用于适合大量涡轮盘的各种探头支架。 探针支架体现了刚性且可扩展的芯，发挥将阵列探头推向燕尾槽内腔的力。 推力在战略上位于燕尾榫的关键区域，导致阵列探头自动引导到燕尾榫中，并提供最佳性能，持续稳定的起飞。

公开(公告)号：US20140028608A1

公开(公告)日：2014-01-30

申请号：US13561333

申请日：2012-07-30

申请人： Jason Habermehl ,  Benoit Lepage ,  Tommy Bourgelas

发明人： Jason Habermehl ,  Benoit Lepage ,  Tommy Bourgelas

IPC分类号： G06F3/045

CPC分类号： G06F3/04845 ,  G01N27/90 ,  G06F3/04847 ,  G06F3/04883 ,  G06F2203/04808

摘要： A touch screen is disclosed which responds to a user's touch for re-drawing, re-scaling, re-translating and re-positioning an impedance plane signal received from non-destructive testing equipment, such as an eddy current sensor. The impedance plane is manipulated by slidingne, two or more fingers simultaneously to an end position to effectuate a complete re-drawing operation of the image.

摘要翻译： 公开了一种触摸屏，其响应用户的触摸以重新绘制，重新缩放，重新平移和重新定位从诸如涡流传感器的非破坏性测试设备接收的阻抗平面信号。 通过将两个或更多个手指同时滑动到结束位置来操纵阻抗平面，以实现图像的完全重绘操作。

公开(公告)号：US08519702B2

公开(公告)日：2013-08-27

申请号：US12847074

申请日：2010-07-30

申请人： Benoit Lepage

发明人： Benoit Lepage

IPC分类号： G01N27/82

CPC分类号： G01N27/904

摘要： An orthogonal eddy current probe with at least three coils, each of the coils is wound across the two facing sides of an at least six-sided right polygonal [b1] prism. At each time interval, two of the three coils are used as driver coils, being charged simultaneously with electric current driven in coherent directions to induce a combined eddy current and one of the coils is used as a receiver coil to sense the eddy current, with the combined eddy current to be orthogonal to the receiver coil. Each coil alternates to be one of the driver coils or the receiver coil at a predetermined switching sequence and a predetermined switching frequency during consecutive time intervals. The eddy current probe provides advantages of inspecting a test surface for flaws of any flaw orientation with one pass of scan, providing sufficient sensitivity and desirable noise cancellation in all directions.

摘要翻译： 具有至少三个线圈的正交涡流探针，每个线圈缠绕在至少六边形的右多边形[b1]棱镜的两个相对的侧面上。 在每个时间间隔，三个线圈中的两个被用作驱动器线圈，与相干方向驱动的电流同时充电以引起组合的涡流，并且其中一个线圈用作接收器线圈以感测涡流， 组合的涡流与接收器线圈正交。 每个线圈在连续的时间间隔期间以预定的切换顺序和预定的切换频率交替为驱动线圈或接收器线圈之一。 涡流探头提供了通过一次扫描检查测试表面以获得任何缺陷取向缺陷的优点，从而在所有方向提供足够的灵敏度和所需的噪声消除。

公开(公告)号：US20120007595A1

公开(公告)日：2012-01-12

申请号：US12832620

申请日：2010-07-08

申请人： Benoit Lepage

发明人： Benoit Lepage

IPC分类号： G01R33/12

CPC分类号： G01N27/904 ,  G01N27/9006

摘要： The invention herein disclosed provides a 2D coil and a method of using the 2D wound EC sensor for reproducing the Eddy Current Testing (ECT) response of a prior art 3D orthogonal sensor. The 3D orthogonal sensor is conventionally wound onto a 3D core, with at least some of the surfaces being un-parallel to the surface be inspected. Using the herein disclosed 2D configuration allows the use of printed circuit board technologies for the manufacturing of these EC sensors. The herein disclosed method and the associated 2D EC sensors are particularly useful for reproducing the EC effect of conventional orthogonal probe arrays.

摘要翻译： 本文公开的本发明提供了2D线圈和使用2D缠绕EC传感器来再现现有技术3D正交传感器的涡流测试（ECT）响应的方法。 3D正交传感器通常缠绕在3D芯上，其中至少一些表面不平行于表面进行检查。 使用本文公开的2D配置允许使用印刷电路板技术来制造这些EC传感器。 本文公开的方法和相关联的2D EC传感器对于再现常规正交探针阵列的EC效应特别有用。

公开(公告)号：US20110234212A1

公开(公告)日：2011-09-29

申请号：US12748614

申请日：2010-03-29

申请人： Benoit LEPAGE ,  Chunyan Tricia LIU

发明人： Benoit LEPAGE ,  Chunyan Tricia LIU

IPC分类号： G01N27/82

CPC分类号： G01N27/82 ,  H01F7/0226 ,  H01F7/0294

摘要： Disclosed are a method and an improvement to the existing conventional magnetic flux leakage inspection device that employ some fixed magnets that are fixed inside the magnet yoke and some movably adjustable magnets, allowing their dipole orientation to be adjusted between 0° and 180° relative to that of the fixed magnets. A lever and gear set connected to the adjustable magnets can be operated to achieve desired level of magnetic strength of the device, including turning off the whole magnetic field, by causing the fields of the fixed and adjustable magnets to cancel each other. The disclosed adjustable yoke can also be used in other NDT/NDI applications where providing an adjustable magnetic strength is desirable.

摘要翻译： 公开了现有的常规漏磁检查装置的方法和改进，该检测装置采用固定在磁轭内的一些固定磁体和一些可移动可调节的磁体，使得它们的偶极方向可相对于0°至180°调节 的固定磁体。 连接到可调磁体的杆和齿轮组可以通过使固定和可调磁体的磁场互相抵消来实现装置的所需磁化强度，包括关闭整个磁场。 所公开的可调磁轭也可以用于提供可调磁力强度的其它NDT / NDI应用中。

公开(公告)号：US20110025316A1

公开(公告)日：2011-02-03

申请号：US12533417

申请日：2009-07-31

申请人： Denis Faucher ,  Benoit Lepage

发明人： Denis Faucher ,  Benoit Lepage

IPC分类号： G01N27/82

CPC分类号： G01N27/9026

摘要： An eddy current probe assembly suitable for inspecting a test object with longitudinal shape, being passed through the assembly in the object's axial direction during an inspection session, the probe assembly comprising multiple probe modules being disposed in a radial plane and with the modules partially overlaying on each other forming an iris structure encircling an inspection zone, wherein a movement in unison of each of the probe modules closer to or further away from the center of the inspection zone makes the inspection zone enlarged or contracted. Spring tension is applied on each of the probe modules so that constant life-off in maintained between the probe modules and the test surface. Array of eddy current elements for each probe module and multiple layers of probe modules can be employed to achieve complete coverage of the test surface. The radial cross-sectional shapes of the test objects can be of round or polygonal.

摘要翻译： 一种适用于检查具有纵向形状的测试对象的涡流探针组件，在检查过程期间沿物体的轴向方向穿过组件，探针组件包括多个探针模块，其设置在径向平面中，并且模块部分地覆盖在 彼此形成围绕检查区域的虹膜结构，其中每个探针模块的移动更靠近或远离检查区域的中心，使得检查区域扩大或收缩。 在每个探针模块上施加弹簧张力，使得在探针模块和测试表面之间保持恒定的寿命。 可以使用每个探针模块和多层探针模块的涡流元件阵列来实现测试表面的完全覆盖。 测试对象的径向横截面形状可以是圆形或多边形。