发明授权
- 专利标题: Non-destructive inspection system having self-aligning probe assembly
- 专利标题(中): 具有自对准探针组件的无损检测系统
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申请号: US12475101申请日: 2009-05-29
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公开(公告)号: US08020308B2公开(公告)日: 2011-09-20
- 发明人: Byungwoo Lee , Yanyan Wu , Nicholas Joseph Kray
- 申请人: Byungwoo Lee , Yanyan Wu , Nicholas Joseph Kray
- 申请人地址: US NY Niskayuna
- 专利权人: General Electric Company
- 当前专利权人: General Electric Company
- 当前专利权人地址: US NY Niskayuna
- 代理商 Penny A. Clarke
- 主分类号: G01R1/067
- IPC分类号: G01R1/067 ; G01D5/28 ; G01B5/012 ; G01B7/012
摘要:
An inspection system comprises a sensor configured to acquire inspection data of the object, a motion control device, a joint assembly coupled to the motion control device, and a probe housing coupled to the joint assembly and configured to hold the sensor. The inspection system further comprises a compliant element coupled to the probe housing and configured to cooperate with the joint assembly and the motion control device to position the sensor relative to the object. A self-aligning probe assembly is also presented.
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