Invention Grant
- Patent Title: Structure of thermal resistive layer and the method of forming the same
- Patent Title (中): 热电阻层的结构及其形成方法
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Application No.: US12630204Application Date: 2009-12-03
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Publication No.: US08029890B2Publication Date: 2011-10-04
- Inventor: Jung-Fang Chang , Te-Chi Wong , Chien-Te Hsieh , Chin-Jen Huang , Yu-Hung Chen
- Applicant: Jung-Fang Chang , Te-Chi Wong , Chien-Te Hsieh , Chin-Jen Huang , Yu-Hung Chen
- Applicant Address: TW Hsin-Chu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsin-Chu
- Agency: WPAT, PC
- Agent Justin King
- Priority: TW93133566A 20041104
- Main IPC: B32B3/26
- IPC: B32B3/26

Abstract:
The prevent invention discloses a structure of thermal resistive layer and the method of forming the same. The thermal resistive structures, formed on a plastic substrate, comprises a porous layer, formed on said plastic substrate, including a plurality of oxides of hollow structure, and a buffer layer, formed on said porous layer, wherein said porous layer can protect said plastic substrate from damage caused by the heat generated during manufacturing process. With the structure and method disclosed above, making a thin film transistor and forming electronic devices on the plastic substrate in the technology of Low Temperature PolySilicon, i.e. LTPS, without changing any parameters is easy to carry out.
Public/Granted literature
- US20100080977A1 STRUCTURE OF THERMAL RESISTIVE LAYER AND THE METHOD OF FORMING THE SAME Public/Granted day:2010-04-01
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