发明授权
- 专利标题: Structure for an absolute duty cycle measurement circuit
- 专利标题(中): 绝对占空比测量电路的结构
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申请号: US12129945申请日: 2008-05-30
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公开(公告)号: US08032850B2公开(公告)日: 2011-10-04
- 发明人: David W. Boerstler , Eskinder Hailu , Masaaki Kaneko , Jieming Qi , Bin Wan
- 申请人: David W. Boerstler , Eskinder Hailu , Masaaki Kaneko , Jieming Qi , Bin Wan
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 代理商 Stephen J. Walder, Jr.; Matthew B Talpis
- 主分类号: G06F17/50
- IPC分类号: G06F17/50 ; G01R23/00 ; G01R29/26
摘要:
A design structure for a circuit for measuring the absolute duty cycle of a signal, is provided. A non-inverted path from a signal source is selected and various DCC circuit setting indices are cycled through until a divider, coupled to the output of the DCC circuit, fails. A first minimum pulse width at which the divider fails is then determined based on the index value of the DCC circuit at the time of the failure. An inverted path from the signal source is selected and the various DCC circuit setting indices are cycled through again until the divider fails. A second minimum pulse width at which the divider fails is then determined based on the index value of the DCC circuit at the time of this second failure. The duty cycle is then calculated based on a difference of the first and second minimum pulse width values.