发明授权
US08035278B2 Ultrasonic probe, ultrasonic diagnosis apparatus, and ultrasonic probe manufacturing method
有权
超声波探头,超声波诊断装置和超声波探头制造方法
- 专利标题: Ultrasonic probe, ultrasonic diagnosis apparatus, and ultrasonic probe manufacturing method
- 专利标题(中): 超声波探头,超声波诊断装置和超声波探头制造方法
-
申请号: US12274689申请日: 2008-11-20
-
公开(公告)号: US08035278B2公开(公告)日: 2011-10-11
- 发明人: Hiroyuki Shikata , Takashi Takeuchi
- 申请人: Hiroyuki Shikata , Takashi Takeuchi
- 申请人地址: JP Tokyo JP Otawara-shi
- 专利权人: Kabushiki Kaisha Toshiba,Toshiba Medical Systems Corporation
- 当前专利权人: Kabushiki Kaisha Toshiba,Toshiba Medical Systems Corporation
- 当前专利权人地址: JP Tokyo JP Otawara-shi
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2007-303253 20071122
- 主分类号: H01L41/08
- IPC分类号: H01L41/08
摘要:
A plurality of piezoelectric elements are arrayed two-dimensionally. A plurality of electrodes are respectively formed on the plurality of piezoelectric elements. A plurality of non-conductive members have columnar shape and are arranged on the plurality of electrodes. A plurality of internal metal layers are respectively provided for the plurality of non-conductive members. The internal metal layers reach from arrangement surfaces of the non-conductive members to other surfaces of the non-conductive members. The arrangement surfaces are opposite to the other surfaces.
公开/授权文献
信息查询
IPC分类: