发明授权
- 专利标题: Performance solid state detectors
- 专利标题(中): 性能固态检测器
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申请号: US12065904申请日: 2006-08-18
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公开(公告)号: US08039808B2公开(公告)日: 2011-10-18
- 发明人: Rob van Asselt , Frans H. M. Sanders
- 申请人: Rob van Asselt , Frans H. M. Sanders
- 申请人地址: NL Eindhoven
- 专利权人: Koninklijke Philips Electronics N.V.
- 当前专利权人: Koninklijke Philips Electronics N.V.
- 当前专利权人地址: NL Eindhoven
- 国际申请: PCT/IB2006/052868 WO 20060818
- 国际公布: WO2007/031886 WO 20070322
- 主分类号: H01L27/146
- IPC分类号: H01L27/146
摘要:
An imaging detector is formed from a conversion material and electrodes that are separated by trenches formed in the conversion material. The trenches increase the distance of the conductance path between electrodes or accommodate a grid of electrodes, thereby reducing current leakage between electrodes. In some embodiments, a passivation layer is used to provide improved adhesion of the electrodes to the conversion material or to shield the electrodes from grid electrode structures.
公开/授权文献
- US20080245967A1 Performance Solid State Detectors 公开/授权日:2008-10-09
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