发明授权
- 专利标题: Survey meter
- 专利标题(中): 测量仪表
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申请号: US11938507申请日: 2007-11-12
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公开(公告)号: US08044356B2公开(公告)日: 2011-10-25
- 发明人: Akio Sumita , Syunichiro Makino , Mikio Izumi , Tetsuo Goto
- 申请人: Akio Sumita , Syunichiro Makino , Mikio Izumi , Tetsuo Goto
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JPP2006-306570 20061113
- 主分类号: G01T1/20
- IPC分类号: G01T1/20
摘要:
A survey meter for measuring a radioactive contamination caused in an inner surface of a pipe includes a radiation detecting section and a signal processing section. The radiation detecting section includes a rod-shaped light guide unit, a reflecting portion connected to one end surface of the light guide unit, a photoelectric transfer unit, for outputting an electronic signal, connected to another one end surface of the light guide unit, and a scintillator unit provided to a circumference of the light guide unit. The signal processing section includes a pulse height discriminator for outputting a logic signal at a time when a pulse height value of the electronic signal outputted from the photoelectric transfer unit is higher than a threshold value, a counter unit for counting the logic signal, a contamination judging unit for judging whether a radioactive contamination is caused or not, and a display unit for displaying the value counted by the counter unit and a contamination judging result judged by the contamination judging unit.
公开/授权文献
- US20100282975A1 SURVEY METER 公开/授权日:2010-11-11
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