A process control system integrates the collection and analysis of process control data used to perform certain computationally expensive process control functions, like adaptive model generation and tuning parameter generation, in the same control device in which one or more of the process control routines are implemented, to thereby provide for faster and more efficient support of the process control routines. This system replaces a layered approach using multiple processing devices by integrating an analytical server which performs computationally expensive analyses used by one or more control routines directly into the real-time control device in which the one or more control routines are located. This integration provides the ability to analyze large quantities of data for multiple process loops controlled by a particular device in a fast and efficient manner.