Invention Grant
- Patent Title: Method and system to analyze rules
- Patent Title (中): 方法和系统分析规则
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Application No.: US12777061Application Date: 2010-05-10
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Publication No.: US08046321B2Publication Date: 2011-10-25
- Inventor: Josh Loftus , Venkat Sundaranatha , Louis Marcel Gino Monier , Jean-Michel Leon , Aditya Arora , Benjamin David Foster , Seema Shah
- Applicant: Josh Loftus , Venkat Sundaranatha , Louis Marcel Gino Monier , Jean-Michel Leon , Aditya Arora , Benjamin David Foster , Seema Shah
- Applicant Address: US CA San Jose
- Assignee: eBay Inc.
- Current Assignee: eBay Inc.
- Current Assignee Address: US CA San Jose
- Agency: Schwegman, Lundberg & Woessner, P.A.
- Main IPC: G06F17/00
- IPC: G06F17/00 ; G06F17/30

Abstract:
A method and system to analyze rules is described. The system receives a query and applies a first plurality of rules to the query to identify a second plurality of rules that respectively identify at least one matching keyword in the query. Next, the system counts the first plurality of rules to identify a total quantity of rules applied to the query and further counts the second plurality of rules to identify a second quantity of rules that respectively identify at least one matching keyword in the query. Finally, the system determines a percentage of coverage for the query based on the total quantity of rules and the second quantity of rules.
Public/Granted literature
- US20100217741A1 METHOD AND SYSTEM TO ANALYZE RULES Public/Granted day:2010-08-26
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