发明授权
- 专利标题: Method for making multi-step photodiode junction structure for backside illuminated sensor
- 专利标题(中): 背面照明传感器制作多步光电二极管结构的方法
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申请号: US11537265申请日: 2006-09-29
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公开(公告)号: US08053287B2公开(公告)日: 2011-11-08
- 发明人: Tzu-Hsuan Hsu , Dun-Nian Yaung
- 申请人: Tzu-Hsuan Hsu , Dun-Nian Yaung
- 申请人地址: TW Hsin-Chu
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW Hsin-Chu
- 代理机构: Haynes and Boone, LLP
- 主分类号: H01L21/339
- IPC分类号: H01L21/339
摘要:
A method of making a backside illuminated sensor is provided. A substrate is provided and a high energy ion implantation is performed over the substrate to implant a first doped region. A layer is formed over the substrate and a self-align high energy ion implantation is performed over the substrate to implant a second doped region over the first doped region. The combined thickness of the first and second doped region is greater than 50 percent of thickness of the substrate and the distance between back surface of the substrate and the first and second doped regions is less than 50 percent of thickness of the substrate. In this way, an enlarged light sensing region is formed through which electrons generated from back surface of the surface may easily reach the pixel.
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