Invention Grant
- Patent Title: Electrical multilayer component with reduced parasitic capacitance
- Patent Title (中): 降低寄生电容的电气多层组件
-
Application No.: US11993273Application Date: 2006-06-19
-
Publication No.: US08058965B2Publication Date: 2011-11-15
- Inventor: Christian Block , Holger Flühr , Alois Kleewein , Günter Pudmich , Heinz Ragossnig
- Applicant: Christian Block , Holger Flühr , Alois Kleewein , Günter Pudmich , Heinz Ragossnig
- Applicant Address: DE Munich
- Assignee: EPCOS AG
- Current Assignee: EPCOS AG
- Current Assignee Address: DE Munich
- Agency: Fish & Richardson P.C.
- Priority: DE102005028498 20050620
- International Application: PCT/EP2006/005872 WO 20060619
- International Announcement: WO2006/136359 WO 20061228
- Main IPC: H01C7/10
- IPC: H01C7/10

Abstract:
An electrical multi-layer component includes a body having a stack of ceramic layers, with a top and a bottom. First and second connection surfaces are on the bottom of the body. Electrode surfaces are in metallization layers among the ceramic layers. Via contacts are between metallization layers. At least one of the via contacts is connected electrically to an electrode surface or to a connection surface. An electrode surface connected to one of the connection surfaces, through a corresponding via contact, is a first electrode structure or a second electrode structure. At least one of the first or second electrode structures includes a via contact that has a blind end. A shortest distance between the first and second electrode structures is a vertical distance from the blind end to: (i) a metallization layer above or below the blind end, or (ii) a blind end of another electrode structure.
Public/Granted literature
- US20110037559A1 ELECTRICAL MULTILAYER COMPONENT WITH REDUCED PARASITIC CAPACITANCE Public/Granted day:2011-02-17
Information query