发明授权
- 专利标题: X-ray detector and manufacturing method thereof
- 专利标题(中): X射线检测器及其制造方法
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申请号: US12354135申请日: 2009-01-15
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公开(公告)号: US08067745B2公开(公告)日: 2011-11-29
- 发明人: Kwan-Wook Jung , Kyung-Sang Goo , Dae-Ho Choo
- 申请人: Kwan-Wook Jung , Kyung-Sang Goo , Dae-Ho Choo
- 申请人地址: KR
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR
- 代理机构: Cantor Colburn LLP
- 优先权: KR10-2008-0012632 20080212
- 主分类号: H01L27/146
- IPC分类号: H01L27/146 ; H05G1/64
摘要:
An X-ray detector includes; a panel having a plurality of photo-detecting pixels generating electrical signals in response to the detection of X-rays, a gate driver providing a gate signal to the plurality of photo-detecting pixels, wherein the photo-detecting pixels output the electrical signals in response to the gate signal, a readout integrated circuit reading out the electrical signal in response to the gate signal, a main board including a controller receiving the electrical signal and converting the electrical signal to an image signal, a film attached to the panel and the main board, the film including a signal line electrically connecting the readout integrated circuit to the panel and main board, wherein the readout integrated circuit is mounted on the film, and a shielding layer covering the film and comprising a conductive material, wherein the shielding layer prevents externally applied electromagnetic signals from passing through the film.
公开/授权文献
- US20090202042A1 X-RAY DETECTOR AND MANUFACTURING METHOD THEREOF 公开/授权日:2009-08-13
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