发明授权
US08085041B2 Three-point method and system for fast and robust field mapping for EPI geometric distortion correction
有权
用于EPI几何失真校正的快速和鲁棒的场映射的三点法和系统
- 专利标题: Three-point method and system for fast and robust field mapping for EPI geometric distortion correction
- 专利标题(中): 用于EPI几何失真校正的快速和鲁棒的场映射的三点法和系统
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申请号: US12100811申请日: 2008-04-10
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公开(公告)号: US08085041B2公开(公告)日: 2011-12-27
- 发明人: Pelin Aksit , John Andrew Derbyshire
- 申请人: Pelin Aksit , John Andrew Derbyshire
- 申请人地址: US NY Schenectady US DC Washington
- 专利权人: General Electric Company,The United States of America as represented by the Secretary of the Office of Technology Transfer, National Institute of Health
- 当前专利权人: General Electric Company,The United States of America as represented by the Secretary of the Office of Technology Transfer, National Institute of Health
- 当前专利权人地址: US NY Schenectady US DC Washington
- 代理机构: Ziolkowski Patent Solutions Group, SC
- 主分类号: G01V3/00
- IPC分类号: G01V3/00
摘要:
A system and method for MR magnetic field mapping includes a computer programmed to acquire a first data point at a first location in a first phase image data set, a second data point at the first location in a second phase image data set, a third data point at the first location in a third phase image data set. The first, second, and third phase images are acquired using a first, second, and third TE, respectively. Phase wrapping does not occur among the first and second phase image data sets; however, phase wrapping does occur among the second and third phase image data sets. The computer is also programmed to determine a magnetic field inhomogeneity, wherein the determination of the magnetic field inhomogeneity is based on the first, second, and third data points.
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