Invention Grant
- Patent Title: Probe for removal of particulates from gas sampling stream
- Patent Title (中): 用于从气体采样流中去除颗粒物的探测器
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Application No.: US12368351Application Date: 2009-02-10
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Publication No.: US08087308B2Publication Date: 2012-01-03
- Inventor: Philippe Jean Gauthier , Neil Colin Widmer
- Applicant: Philippe Jean Gauthier , Neil Colin Widmer
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Cantor Colburn LLP
- Main IPC: G01N1/22
- IPC: G01N1/22

Abstract:
A sample probe includes a sample probe tip filter. The sample probe also includes a shield disposed in relation to the sample probe tip filter, the shield being operable to deflect particles in a gas sampling stream away from the sample probe tip filter. The shield has at least one opening that allows the gas within the gas sampling stream and certain ones of the particles in the gas sampling stream both traveling in a substantially flow reversal direction to a primary direction of the gas sampling stream to enter the shield and contact the sample probe tip filter.
Public/Granted literature
- US20100199787A1 PROBE FOR REMOVAL OF PARTICULATES FROM GAS SAMPLING STREAM Public/Granted day:2010-08-12
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