Invention Grant
- Patent Title: Reliable interconnects
- Patent Title (中): 可靠的互连
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Application No.: US12860946Application Date: 2010-08-23
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Publication No.: US08102054B2Publication Date: 2012-01-24
- Inventor: Bei Chao Zhang , Chim Seng Seet , Juan Boon Tan , Fan Zhang , Yong Chiang Ee , Bo Tao , Tong Qing Chen , Liang Choo Hsia
- Applicant: Bei Chao Zhang , Chim Seng Seet , Juan Boon Tan , Fan Zhang , Yong Chiang Ee , Bo Tao , Tong Qing Chen , Liang Choo Hsia
- Applicant Address: SG Singapore
- Assignee: GLOBALFOUNDRIES Singapore Pte. Ltd.
- Current Assignee: GLOBALFOUNDRIES Singapore Pte. Ltd.
- Current Assignee Address: SG Singapore
- Agency: Horizon IP Pte Ltd
- Main IPC: H01L23/48
- IPC: H01L23/48 ; H01L23/50 ; H01L29/40

Abstract:
A method for forming a semiconductor device is presented. The method includes providing a substrate prepared with a dielectric layer formed thereon. The dielectric layer having a conductive line disposed in an upper portion of the dielectric layer. The substrate is processed to produce a top surface of the dielectric layer that is not coplanar with a top surface of the conductive line to form a stepped topography.
Public/Granted literature
- US20100314774A1 RELIABLE INTERCONNECTS Public/Granted day:2010-12-16
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