发明授权
- 专利标题: Semiconductor substrate and method of manufacturing the same
- 专利标题(中): 半导体衬底及其制造方法
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申请号: US12471771申请日: 2009-05-26
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公开(公告)号: US08105938B2公开(公告)日: 2012-01-31
- 发明人: Hitoshi Ito
- 申请人: Hitoshi Ito
- 申请人地址: JP Nagano-shi, Nagano
- 专利权人: Shinko Electric Industries Co., Ltd.
- 当前专利权人: Shinko Electric Industries Co., Ltd.
- 当前专利权人地址: JP Nagano-shi, Nagano
- 代理机构: Drinker Biddle & Reath LLP
- 优先权: JP2008-139155 20080528
- 主分类号: H01L21/4763
- IPC分类号: H01L21/4763 ; H01L21/768
摘要:
There is provided a method of manufacturing a semiconductor substrate. The method includes: (a) forming a wiring pattern on a substrate; (b) covering the wiring pattern with an insulating resin, thereby forming a first insulating layer; (c) forming a second insulating layer on the first insulating layer; (d) forming a plurality of grooves through the second insulating layer; (e) forming at least one via hole through the first and second insulating layers by irradiating at least one of the grooves with a laser beam; (f) forming a seed metal layer on an inner surface of the at least one via hole, inner surfaces of the grooves, and a surface of the second insulating layer; and (g) forming a plating layer in the at least one via hole and the grooves, by an electrolytic plating using the seed metal layer as a power feeding layer.
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