发明授权
- 专利标题： Microscopic infrared analysis by X-ray or electron radiation
- 专利标题（中）： 通过X射线或电子辐射进行微观红外分析
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申请号： US12789823申请日： 2010-05-28
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公开(公告)号： US08106360B2公开(公告)日： 2012-01-31
- 发明人: Richard A. Rosenberg
- 申请人： Richard A. Rosenberg
- 申请人地址： US IL Chicago
- 专利权人： UChicago Argonne, LLC
- 当前专利权人： UChicago Argonne, LLC
- 当前专利权人地址： US IL Chicago
- 代理商 Joan Pennington
- 主分类号： G01J5/02
- IPC分类号： G01J5/02
摘要：
An infrared (IR) emission spectroscopy and microscopy apparatus with X-ray excitation or electron excitation and an improved process for extending spatial relation of infrared (IR) microscopy and performing microscopic infrared (IR) analysis by X-ray or electron radiation are provided. By utilizing nanometer sized X-ray beams or electron beams to produce IR emission, the spatial resolution of IR microscopy is extended. Simultaneously performing X-ray or electron-based spectroscopy as well as structural studies are enabled.
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