An apparatus, system, and method are disclosed for measuring magnetoresistive head assembly resistance. A measurement module measures a reference voltage across a reference resistance while applying a reference current to the reference resistance. In addition, the measurement module measures a test voltage across a first biasing resistor, a MR head assembly, and a second biasing resistor connected in series while applying the reference current to the first biasing resistor, the MR head assembly, and the second biasing resistor. A computation module calculates the MR head assembly resistance from the reference voltage, the test voltage, the reference resistance, and the resistances of the first and second biasing resistors.