Invention Grant
- Patent Title: Spectrometric measurement system and method for compensating for veiling glare
- Patent Title (中): 光谱测量系统和补偿眩光的方法
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Application No.: US12225904Application Date: 2007-03-12
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Publication No.: US08111396B2Publication Date: 2012-02-07
- Inventor: Felix Kerstan , Nico Correns , Joerg Margraf
- Applicant: Felix Kerstan , Nico Correns , Joerg Margraf
- Applicant Address: DE Jena
- Assignee: Carl Zeiss MicroImaging GmbH
- Current Assignee: Carl Zeiss MicroImaging GmbH
- Current Assignee Address: DE Jena
- Agency: Frommer Lawrence & Haug LLP
- Priority: DE102006015269 20060401
- International Application: PCT/EP2007/002128 WO 20070312
- International Announcement: WO2007/115628 WO 20071018
- Main IPC: G01J3/28
- IPC: G01J3/28 ; G01J3/36

Abstract:
The present solution is directed to a measuring system and a method for determining spectrometric measurement results with high accuracy. The spectrometric measuring system, comprises a radiation source, an entrance slit, a dispersion element, and a detector with detector elements arranged in a linear or matrix-shaped manner in one or more planes. The detector has an even distribution of at least two different wavelength-selective filters on its detector elements. While detectors from photography and video applications are used for this purpose, use of the invention is not limited to the visible spectral region. Further, color filters on the pixels may be omitted or modified in the manufacturing process. It is also possible to use other types of detectors in which the wavelength-selective filters and associated detectors are arranged one behind each other in a plurality of planes in which complete color information is available to each individual picture point.
Public/Granted literature
- US20090168060A1 Spectrometric Measurement System and Method for Compensating for Veiling Glare Public/Granted day:2009-07-02
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