公开(公告)号：US07082003B2

公开(公告)日：2006-07-25

申请号：US10415213

申请日：2002-03-19

Applicant: Nico Correns ,  Ullrich Klarner ,  Werner Hoyme ,  Felix Kerstan

Inventor： Nico Correns ,  Ullrich Klarner ,  Werner Hoyme ,  Felix Kerstan

IPC: G02B7/02 ,  H01J3/14

CPC classification number: G02B27/0006 ,  G01J3/02 ,  G01J3/0286 ,  G01J5/02 ,  G01J5/0285 ,  G02B7/02

Abstract: In order to provide an arrangement for pressure compensation for optical devices, particularly spectrometers or the like optical devices, for compensating pressure differences caused by changes in temperature and air pressure between the internal pressure and the external pressure at a housing of an optical device enclosing optical units, which arrangement prevents a contamination of optical functional surfaces of the optical units of the optical device and ensures a constant pressure balance between the interior space and the external surroundings of the housing of an optical device with its optical units while economizing on manufacturing costs, it is proposed that the arrangement for pressure compensation comprises at least one pressure compensating element which is constructed on both sides so as to be permeable to air and which is arranged in a housing opening of the housing wall of the optical device enclosing the optical units.

Abstract translation: 为了提供用于光学装置，特别是光谱仪等的光学装置的压力补偿装置，用于补偿由封闭光学装置的光学装置的壳体处的内部压力和外部压力之间的温度和空气压力变化引起的压力差 单元，这种布置防止光学装置的光学单元的光学功能表面的污染，并且通过其光学单元确保光学装置的壳体的内部空间和外部周围之间的恒定的压力平衡，同时节省制造成本， 提出了用于压力补偿的装置包括至少一个压力补偿元件，该压力补偿元件构造在两侧以便能够透过空气并且布置在包围光学单元的光学装置的壳体壁的壳体开口中。

公开(公告)号：US4856898A

公开(公告)日：1989-08-15

申请号：US166870

申请日：1988-03-11

Applicant: Helmut Becker-Ross ,  Stefan Florek ,  Felix Kerstan ,  Guenther Moebius ,  Horst Sanders

Inventor： Helmut Becker-Ross ,  Stefan Florek ,  Felix Kerstan ,  Guenther Moebius ,  Horst Sanders

IPC: G01J3/04 ,  G01J3/12 ,  G01J3/18

CPC classification number: G01J3/04 ,  G01J3/1809 ,  G01J2003/1208

Abstract: An adjustable Echelle spectrometer arrangement which can be used in single- and multi-element analysis by the emission or absorption of optical radiation. To compensate all the manufacturing and setup errors, the only arrangements present are those to change the height of the entry slit arrangement above the base plate and to rotate the dispersion prism about a first axis, approximately parallel to its roof edge, and about a second axis, that is vertical thereto. This compensates for the effect of errors associated with component and setup parameters which results from greater tolerances, without impairing mechanical and thermal stability and imaging quality.

Abstract translation: 可调节的Echelle光谱仪布置，可用于通过发射或吸收光学辐射的单元素和多元素分析。 为了补偿所有的制造和设置误差，存在的仅仅是在基板上方改变进入狭缝布置的高度并使分散棱镜围绕大致平行于其屋顶边缘的第一轴线旋转的大约第二 轴，与其垂直。 这补偿了由较大公差引起的与部件和设置参数相关的误差的影响，而不损害机械和热稳定性和成像质量。

公开(公告)号：US08111396B2

公开(公告)日：2012-02-07

申请号：US12225904

申请日：2007-03-12

Applicant: Felix Kerstan ,  Nico Correns ,  Joerg Margraf

Inventor： Felix Kerstan ,  Nico Correns ,  Joerg Margraf

IPC: G01J3/28 ,  G01J3/36

CPC classification number: G01J3/2803 ,  G01J3/0262 ,  G01J3/36 ,  G01J3/51

Abstract: The present solution is directed to a measuring system and a method for determining spectrometric measurement results with high accuracy. The spectrometric measuring system, comprises a radiation source, an entrance slit, a dispersion element, and a detector with detector elements arranged in a linear or matrix-shaped manner in one or more planes. The detector has an even distribution of at least two different wavelength-selective filters on its detector elements. While detectors from photography and video applications are used for this purpose, use of the invention is not limited to the visible spectral region. Further, color filters on the pixels may be omitted or modified in the manufacturing process. It is also possible to use other types of detectors in which the wavelength-selective filters and associated detectors are arranged one behind each other in a plurality of planes in which complete color information is available to each individual picture point.

Abstract translation: 本解决方案涉及测量系统和用于以高精度确定光谱测量结果的方法。 光谱测量系统包括辐射源，入口狭缝，分散元件和具有在一个或多个平面中以线性或矩阵形式布置的检测器元件的检测器。 检测器在其检测器元件上具有至少两个不同波长选择滤波器的均匀分布。 虽然用于摄影和视频应用的检测器用于此目的，但是本发明的使用不限于可见光谱区域。 此外，可以在制造过程中省略或修改像素上的滤色器。 也可以使用其他类型的检测器，其中波长选择滤波器和相关联的检测器在多个平面中相互排列，其中完整的颜色信息可用于每个单独的图像点。

公开(公告)号：US20110007319A1

公开(公告)日：2011-01-13

申请号：US12745158

申请日：2008-12-10

Applicant: Nico Correns ,  Werner Hoyme ,  Felix Kerstan ,  Thomas Keune ,  Wilhelm Schebesta

Inventor： Nico Correns ,  Werner Hoyme ,  Felix Kerstan ,  Thomas Keune ,  Wilhelm Schebesta

IPC: G01N21/55

CPC classification number: G01N21/276 ,  G01N21/4738 ,  G01N2021/4742

Abstract: The invention relates to an arrangement for measuring the reflectivity of the direct or scattered reflection of a sample (8), having a light source for separately lighting the sample (8) and of comparative surfaces. The arrangement comprises, in addition to the light source, preferably a reflector lamp (2), —a white standard (6), a black standard (7), and the surface of the sample (8) for embodying a measurement surface, wherein the exchange of the white standard (6), the black standard (7) and the sample (8) is provided in a prescribed sequence relative to each other, —means for measuring the intensity of the light reflected from an internal white surface (10) and for measuring the intensity of the light reflected from each measuring surface, and—an evaluation circuit designed for registering the measured intensity values and for linking the same mathematically to the reflectivity.

Abstract translation: 本发明涉及一种用于测量样品（8）的直接或散射反射的反射率的装置，其具有用于分别照亮样品（8）和比较表面的光源。 除了光源之外，该装置优选地包括反射灯（2），白色标准（6），黑色标准（7）和用于体现测量表面的样品（8）的表面，其中 以规定的顺序相对于白色标准（6），黑色标准（7）和样品（8）的交换提供 - 用于测量从内部白色表面（10）反射的光的强度 ）并且用于测量从每个测量表面反射的光的强度，以及设计用于记录所测量的强度值并将数学上与反射率相关联的评估电路。

公开(公告)号：US07573023B2

公开(公告)日：2009-08-11

申请号：US11335937

申请日：2006-01-20

Applicant: Felix Kerstan ,  Ulrich Zeh

Inventor： Felix Kerstan ,  Ulrich Zeh

IPC: H01J7/24

CPC classification number: G01J3/02 ,  G01J3/0286 ,  G01J3/2803

Abstract: The present invention is directed to an arrangement and the associated method for the compensation of the temperature dependency of detectors in spectrometers. In the solution according to the invention, the arrangement for compensation of the temperature dependency of detectors in spectrometers comprises an illumination unit, an entrance slit, an imaging grating, a detector and a controlling and evaluating unit. A second temperature gauge for the ambient temperature is provided in addition to an existing first temperature gauge and a temperature regulating unit. In the method according to the invention, a temperature regulating unit is controlled in such a way by a controlling and evaluating unit in the evaluation of the measurement values determined by two temperature gauges that the temperature of the detector remains constant. With the arrangement according to the invention, the cross-influence of the environment on the detector can be compensated so that the stabilization of the detector temperature is improved. Improved stabilization of the detector temperature is ensured by the additional component of ambient temperature.

Abstract translation: 本发明涉及一种用于补偿光谱仪中检测器的温度依赖性的布置和相关方法。 在根据本发明的解决方案中，用于补偿光谱仪中检测器的温度依赖性的装置包括照明单元，入口狭缝，成像光栅，检测器和控制和评估单元。 除了现有的第一温度计和温度调节单元之外，还提供了用于环境温度的第二温度计。 在根据本发明的方法中，温度调节单元通过控制和评估单元在由两个温度计确定的测量值的评估中被控制，使得检测器的温度保持恒定。 利用根据本发明的布置，可以补偿环境对检测器的交叉影响，从而提高检测器温度的稳定性。 通过环境温度的附加组件确保提高检测器温度的稳定性。

公开(公告)号：US07369228B2

公开(公告)日：2008-05-06

申请号：US10544555

申请日：2003-12-19

Applicant: Felix Kerstan ,  Ullrich Klarner ,  Nico Correns ,  Gregor Tumpach

Inventor： Felix Kerstan ,  Ullrich Klarner ,  Nico Correns ,  Gregor Tumpach

IPC: G01J3/36

CPC classification number: G01J3/02 ,  G01J3/0256 ,  G01J3/0291

Abstract: The present invention is directed to a spectrometer in which the electrical and optical components are connected to one another in a compact construction. A minimal expenditure on assembly and adjustment is achieved through a small quantity of individual parts. The compact spectrometer comprises an entrance slit, an imaging grating, one or more detector elements in rows or matrices, and elements of a controlling and evaluating unit. The detector elements and the entrance slit are arranged on a shared support, the elements of the controlling and evaluating unit being arranged on the free surfaces of the support. The entrance slit and the detector elements and the imaging spherical grating recessed into the spectrometer housing are arranged symmetric to an imaginary center axis of the support. Due to its compact size and the minimized expenditure on adjustment and assembly for its manufacture, the inventive spectrometer has numerous applications.

Abstract translation: 本发明涉及一种其中电气和光学部件以紧凑的结构相互连接的光谱仪。 组装和调整的最小支出是通过少量的个别部件实现的。 紧凑型光谱仪包括入口狭缝，成像光栅，行或矩阵中的一个或多个检测器元件，以及控制和评估单元的元件。 检测器元件和入口狭缝布置在共享支撑件上，控制和评估单元的元件布置在支撑件的自由表面上。 凹入光谱仪壳体的入射狭缝和探测器元件和成像球形光栅与支撑体的假想中心轴线对称。 由于其紧凑的尺寸和用于其制造的调整和组装的最小化的支出，本发明的光谱仪具有许多应用。

公开(公告)号：US20060139636A1

公开(公告)日：2006-06-29

申请号：US10544555

申请日：2003-12-19

Applicant: Felix Kerstan ,  Ullrich Klarner ,  Nico Correns ,  Gregor Tumpach

Inventor： Felix Kerstan ,  Ullrich Klarner ,  Nico Correns ,  Gregor Tumpach

IPC: G01J3/28

CPC classification number: G01J3/02 ,  G01J3/0256 ,  G01J3/0291

Abstract: The present invention is directed to a spectrometer in which the electrical and optical components are connected to one another in a compact construction. A minimal expenditure on assembly and adjustment is achieved through a small quantity of individual parts. The compact spectrometer comprises an entrance slit, an imaging grating, one or more detector elements in rows or matrices, and elements of a controlling and evaluating unit. The detector elements and the entrance slit are arranged on a shared support, the elements of the controlling and evaluating unit being arranged on the free surfaces of the support. The entrance slit and the detector elements and the imaging spherical grating recessed into the spectrometer housing are arranged symmetric to an imaginary center axis of the support. Due to its compact size and the minimized expenditure on adjustment and assembly for its manufacture, the spectrometer according to the invention has applications ranging from routine laboratory analysis to special tasks in process measurement technique and quality control in manufacturing processes.

Abstract translation: 本发明涉及一种其中电气和光学部件以紧凑的结构相互连接的光谱仪。 组装和调整的最小支出是通过少量的个别部件实现的。 紧凑型光谱仪包括入口狭缝，成像光栅，行或矩阵中的一个或多个检测器元件，以及控制和评估单元的元件。 检测器元件和入口狭缝布置在共享支撑件上，控制和评估单元的元件布置在支撑件的自由表面上。 凹入光谱仪壳体的入射狭缝和探测器元件和成像球形光栅与支撑体的假想中心轴线对称。 由于其紧凑的尺寸和用于其制造的调整和组装的最小化的支出，根据本发明的光谱仪具有从常规实验室分析到过程测量技术中的特殊任务以及制造过程中的质量控制的应用。

公开(公告)号：US06654186B2

公开(公告)日：2003-11-25

申请号：US10098901

申请日：2002-03-14

Applicant: Ullrich Klarner ,  Nico Correns ,  Werner Hoyme ,  Felix Kerstan

Inventor： Ullrich Klarner ,  Nico Correns ,  Werner Hoyme ,  Felix Kerstan

IPC: G02B702

CPC classification number: G02B7/00

Abstract: An arrangement for fixing an optical component part in position in a device housing, comprising a holder which is connected to a housing and which presses the component part into a cutout in the housing accompanied by pretensioning. The holder is fashioned in one piece from elastic material and is provided with clamps that are formed integral with it, at least one of which clamps presses the component part against a reference plane in direction of one of the coordinates X, Y, Z accompanied by pretensioning, and fastening elements are formed integral with the holder for securing it to the housing.

公开(公告)号：US08102526B2

公开(公告)日：2012-01-24

申请号：US12236889

申请日：2008-09-24

Applicant: Jens Hofmann ,  Nico Correns ,  Lutz Freytag ,  Felix Kerstan ,  Doris Jochmann ,  Carsten Ziener ,  Gerhard Foerschler

Inventor： Jens Hofmann ,  Nico Correns ,  Lutz Freytag ,  Felix Kerstan ,  Doris Jochmann ,  Carsten Ziener ,  Gerhard Foerschler

IPC: G01J3/28

CPC classification number: G01J3/02 ,  G01J3/0202 ,  G01J3/0256 ,  G01J3/0291 ,  G01J3/18

Abstract: A spectrometer including an entrance slit and the production of the entrance slit. The spectrometer includes a housing, an entrance slit, and an imaging diffraction grating inside the housing for splitting and imaging the light onto an optoelectric detector. The detector is arranged inside the housing. The housing and the base plate are connected to each other by mutually cooperating positioning members. The entrance slit, the positioning members of the base plate and the holding members for receiving and mounting the detecting device are integral parts of the base plate and are produced from the base plate in a precise manner, in a suitable form and in defined mutual positions by, for example, laser cutting or liquid jet cutting. The positioning members of the base plate and/or the holding members for the detecting device can be provided as resilient elements.

Abstract translation: 光谱仪包括入口狭缝和入口狭缝的产生。 光谱仪包括壳体，入口狭缝和壳体内的成像衍射光栅，用于将光分解和成像到光电检测器上。 检测器布置在壳体内。 壳体和基板通过相互配合的定位构件相互连接。 入口狭缝，基板的定位构件和用于接收和安装检测装置的保持构件是基板的整体部分，并且以适当的形式和相互定义的相互位置以精确的方式从基板制造 通过例如激光切割或液体射流切割。 基板的定位构件和/或检测装置的保持构件可以设置为弹性元件。

公开(公告)号：US20110255075A1

公开(公告)日：2011-10-20

申请号：US13120821

申请日：2009-10-27

Applicant: Felix Kerstan ,  Nico Correns

Inventor： Felix Kerstan ,  Nico Correns

IPC: G01J3/28

CPC classification number: G01J3/28 ,  G01J3/02 ,  G01J3/027 ,  G01J3/0286

Abstract: The invention relates to a spectrometric assembly and method for determining a temperature value for a detector of a spectrometer. It is conventional to record the detector temperature in an optoelectronic detector using a thermal temperature sensor in order to compensate for temperature fluctuations. Due to the finite distance between the detector and the temperature sensor, the accuracy of the temperature detection is limited. According to the invention, the detector temperature should be recordable at high accuracy and with little effort. In addition to means for spectral division of incident tight and an optical detector for spectrally resolved detection of a spectral range of the divided light, a second optical detector is provided for detection of a partial range of this spectral range as a reference detector, wherein sensitivity of the reference detector is substantially temperature-independent. The ratio of the signals of both detectors is a highly accurate measurement for the relative temperature of the first detector due to the temperature independence of the sensitivity of the reference detector, and can be determined with little effort.

Abstract translation: 本发明涉及一种用于确定光谱仪的检测器的温度值的光谱测量组件和方法。 常规的是使用热温度传感器将检测器温度记录在光电检测器中，以补偿温度波动。 由于检测器和温度传感器之间的距离有限，因此温度检测的精度有限。 根据本发明，检测器温度应该能以高精度和很小的努力进行记录。 除了用于入射光谱的光谱分割的装置和用于光谱分辨检测分光的光谱范围的光学检测器之外，提供第二光学检测器用于检测该光谱范围的部分范围作为参考检测器，其中灵敏度 的参考检测器基本上与温度无关。 由于参考检测器的灵敏度的温度独立性，两个检测器的信号的比率是对第一检测器的相对温度的高精度测量，并且可以很少地确定。