Invention Grant
- Patent Title: Automatic scan and mark apparatus
- Patent Title (中): 自动扫描和标记装置
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Application No.: US12547867Application Date: 2009-08-26
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Publication No.: US08111405B2Publication Date: 2012-02-07
- Inventor: Wen-Yuh Jywe , Chien-Hung Liu , Hung-Shu Wang , Bo-Wei Chen , Jyun-Jia Yang , Wei-Cheng Tsai , Wei-Chung Chang , Ming-Chi Chiang , Jia-Hong Chen
- Applicant: Wen-Yuh Jywe , Chien-Hung Liu , Hung-Shu Wang , Bo-Wei Chen , Jyun-Jia Yang , Wei-Cheng Tsai , Wei-Chung Chang , Ming-Chi Chiang , Jia-Hong Chen
- Applicant Address: TW Yunlin Hsien
- Assignee: National Formosa University
- Current Assignee: National Formosa University
- Current Assignee Address: TW Yunlin Hsien
- Agency: Nikolai & Mersereau, P.A.
- Agent C. G. Mersereau
- Main IPC: G01B11/30
- IPC: G01B11/30 ; G01B11/14

Abstract:
An automatic scan and mark apparatus has a machine tool, a location detection module, a laser detector, an ink jet and a control computer. The machine tool has a movable module and a stage. The stage mounts and holds a specimen having a scraped surface. The control computer controls the location detection module to determine a position of the movable module, controls the laser detector to detect a surface morphology of the scraped surface in a measurement range, and activates the ink jet to eject inks on high points of the scraped surface of the specimen. Thus, the surface morphology is built automatically and high points are screened out and marked by colored ink. Manufacturer may easily redo scraping of determined high points based on the marked location on the specimen without burdensome measurement.
Public/Granted literature
- US20110050771A1 AUTOMATIC SCAN AND MARK APPARATUS Public/Granted day:2011-03-03
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