发明授权
- 专利标题: Parity error detecting circuit and method
- 专利标题(中): 奇偶校验误差检测电路及方法
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申请号: US11829583申请日: 2007-07-27
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公开(公告)号: US08122334B2公开(公告)日: 2012-02-21
- 发明人: Young-Hun Lee , Jae-Youl Lee , Jong-Seon Kim , Kyung-Suc Nah
- 申请人: Young-Hun Lee , Jae-Youl Lee , Jong-Seon Kim , Kyung-Suc Nah
- 申请人地址: KR Suwon-Si
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-Si
- 代理机构: F. Chau & Associates, LLC
- 优先权: KR10-2007-0002312 20070109
- 主分类号: G06F11/10
- IPC分类号: G06F11/10 ; G06F11/28
摘要:
A parity error detecting circuit includes a first operation unit, a second operation unit, and a shift register. The first operation unit receives a serial data signal and a first signal, performs a logic operation on the two received signals, and outputs the result of the logic operation as the first signal in response to a first clock signal. The shift register shifts the first signal in response to the first clock signal and outputs a second signal. The second operation unit receives the first signal and the second signal, performs a logic operation on the two received signals, and outputs the result of the logic operation in response to a second clock signal.
公开/授权文献
- US20080168338A1 PARITY ERROR DETECTING CIRCUIT AND METHOD 公开/授权日:2008-07-10
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